breda
October 26, 2020, 1:27pm
1
The documentation for mbed 5.15 states that the SPI constructor can take NC for the MOSI or MISO pin if it is not used. This compiles fine, but it generates a runtime assert:
Error Message: Assertion failed: pin != (PinName)NC
because the spi_init_direct function in stm_spi_api calls pin_function() at line 172 with the PinName before it checks whether it is NC or not in line 201.
Is there a known work around for this?
Hi
ARMmbed:master ← mprse:spi_init_nc_fix
opened 02:16PM - 18 Feb 20 UTC
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### Summary of changes
This PR fixes issue https://github.com/ARMmbed/mbed-os/issues/12435.
Static pin-map extension required to use `pin_function()` and `pin_mode()` functions instead of `pinmap_pinout()`. Unfortunately `pin_function()` does not allow passing `NC` pin.
The proposition is to call `pin_function()` and `pin_mode()` only if `MISO/MOSI` pin is not `NC`.
Additionally extended SPI FPGA test to verify all possible pin configurations including MISO and MOSI unconnected.
The idea is to add also similar tests for other peripherals if this proposal will be approved. I think that this should be added for peripherals that use more than one pin and provide the availability to specify at least one pin as NC.
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[X] Patch update (Bug fix / Target update / Docs update / Test update / Refactor)
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### Test results
```
| target | platform_name | test suite | result | elapsed_time (sec) | copy_method |
|-----------------------|---------------|----------------------------------------|--------|--------------------|-------------|
| NUCLEO_F429ZI-GCC_ARM | NUCLEO_F429ZI | tests-mbed_hal_fpga_ci_test_shield-spi | OK | 26.39 | default |
mbedgt: test suite results: 1 OK
mbedgt: test case report:
| target | platform_name | test suite | test case | passed | failed | result | elapsed_time (sec) |
|-----------------------|---------------|----------------------------------------|-----------------------------------------------------------|--------|--------|--------|--------------------|
| NUCLEO_F429ZI-GCC_ARM | NUCLEO_F429ZI | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - async mode (hw ss) | 1 | 0 | OK | 0.14 |
| NUCLEO_F429ZI-GCC_ARM | NUCLEO_F429ZI | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - async mode (sw ss) | 1 | 0 | OK | 0.22 |
| NUCLEO_F429ZI-GCC_ARM | NUCLEO_F429ZI | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - basic test | 1 | 0 | OK | 0.38 |
| NUCLEO_F429ZI-GCC_ARM | NUCLEO_F429ZI | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - basic test (direct init) | 1 | 0 | OK | 0.37 |
| NUCLEO_F429ZI-GCC_ARM | NUCLEO_F429ZI | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - block write | 1 | 0 | OK | 0.22 |
| NUCLEO_F429ZI-GCC_ARM | NUCLEO_F429ZI | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - block write(one sym) | 1 | 0 | OK | 0.21 |
| NUCLEO_F429ZI-GCC_ARM | NUCLEO_F429ZI | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - buffers tx < rx | 1 | 0 | OK | 0.22 |
| NUCLEO_F429ZI-GCC_ARM | NUCLEO_F429ZI | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - buffers tx > rx | 1 | 0 | OK | 0.21 |
| NUCLEO_F429ZI-GCC_ARM | NUCLEO_F429ZI | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - frequency testing (2 MHz) | 1 | 0 | OK | 0.22 |
| NUCLEO_F429ZI-GCC_ARM | NUCLEO_F429ZI | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - frequency testing (200 kHz) | 1 | 0 | OK | 0.24 |
| NUCLEO_F429ZI-GCC_ARM | NUCLEO_F429ZI | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - frequency testing (capabilities max) | 1 | 0 | OK | 0.23 |
| NUCLEO_F429ZI-GCC_ARM | NUCLEO_F429ZI | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - frequency testing (capabilities min) | 1 | 0 | OK | 0.24 |
| NUCLEO_F429ZI-GCC_ARM | NUCLEO_F429ZI | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - hardware ss handling | 1 | 0 | OK | 0.14 |
| NUCLEO_F429ZI-GCC_ARM | NUCLEO_F429ZI | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - hardware ss handling(block) | 1 | 0 | OK | 0.14 |
| NUCLEO_F429ZI-GCC_ARM | NUCLEO_F429ZI | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - init/free test all pins | 1 | 0 | OK | 0.54 |
| NUCLEO_F429ZI-GCC_ARM | NUCLEO_F429ZI | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - init/free test all pins (CS == NC) | 1 | 0 | OK | 0.24 |
| NUCLEO_F429ZI-GCC_ARM | NUCLEO_F429ZI | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - init/free test all pins (CS == NC, MISO/MOSI == NC) | 1 | 0 | OK | 0.59 |
| NUCLEO_F429ZI-GCC_ARM | NUCLEO_F429ZI | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - mode testing (MODE_1) | 1 | 0 | OK | 0.23 |
| NUCLEO_F429ZI-GCC_ARM | NUCLEO_F429ZI | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - mode testing (MODE_2) | 1 | 0 | OK | 0.22 |
| NUCLEO_F429ZI-GCC_ARM | NUCLEO_F429ZI | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - mode testing (MODE_3) | 1 | 0 | OK | 0.22 |
| NUCLEO_F429ZI-GCC_ARM | NUCLEO_F429ZI | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - symbol size testing (12) | 1 | 0 | OK | 0.29 |
| NUCLEO_F429ZI-GCC_ARM | NUCLEO_F429ZI | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - symbol size testing (16) | 1 | 0 | OK | 0.24 |
| NUCLEO_F429ZI-GCC_ARM | NUCLEO_F429ZI | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - symbol size testing (24) | 1 | 0 | OK | 0.28 |
| NUCLEO_F429ZI-GCC_ARM | NUCLEO_F429ZI | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - symbol size testing (32) | 1 | 0 | OK | 0.29 |
| NUCLEO_F429ZI-GCC_ARM | NUCLEO_F429ZI | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - symbol size testing (4) | 1 | 0 | OK | 0.28 |
mbedgt: test case results: 25 OK
| target | platform_name | test suite | result | elapsed_time (sec) | copy_method |
|-----------------------------|---------------------|----------------------------------------|--------|--------------------|-------------|
| DISCO_L475VG_IOT01A-GCC_ARM | DISCO_L475VG_IOT01A | tests-mbed_hal_fpga_ci_test_shield-spi | OK | 28.96 | default |
mbedgt: test suite results: 1 OK
mbedgt: test case report:
| target | platform_name | test suite | test case | passed | failed | result | elapsed_time (sec) |
|-----------------------------|---------------------|----------------------------------------|-----------------------------------------------------------|--------|--------|--------|--------------------|
| DISCO_L475VG_IOT01A-GCC_ARM | DISCO_L475VG_IOT01A | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - async mode (hw ss) | 1 | 0 | OK | 0.23 |
| DISCO_L475VG_IOT01A-GCC_ARM | DISCO_L475VG_IOT01A | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - async mode (sw ss) | 1 | 0 | OK | 0.23 |
| DISCO_L475VG_IOT01A-GCC_ARM | DISCO_L475VG_IOT01A | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - basic test | 1 | 0 | OK | 0.27 |
| DISCO_L475VG_IOT01A-GCC_ARM | DISCO_L475VG_IOT01A | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - basic test (direct init) | 1 | 0 | OK | 0.27 |
| DISCO_L475VG_IOT01A-GCC_ARM | DISCO_L475VG_IOT01A | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - block write | 1 | 0 | OK | 0.22 |
| DISCO_L475VG_IOT01A-GCC_ARM | DISCO_L475VG_IOT01A | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - block write(one sym) | 1 | 0 | OK | 0.23 |
| DISCO_L475VG_IOT01A-GCC_ARM | DISCO_L475VG_IOT01A | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - buffers tx < rx | 1 | 0 | OK | 0.22 |
| DISCO_L475VG_IOT01A-GCC_ARM | DISCO_L475VG_IOT01A | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - buffers tx > rx | 1 | 0 | OK | 0.22 |
| DISCO_L475VG_IOT01A-GCC_ARM | DISCO_L475VG_IOT01A | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - frequency testing (2 MHz) | 1 | 0 | OK | 0.22 |
| DISCO_L475VG_IOT01A-GCC_ARM | DISCO_L475VG_IOT01A | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - frequency testing (200 kHz) | 1 | 0 | OK | 0.23 |
| DISCO_L475VG_IOT01A-GCC_ARM | DISCO_L475VG_IOT01A | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - frequency testing (capabilities max) | 1 | 0 | OK | 0.24 |
| DISCO_L475VG_IOT01A-GCC_ARM | DISCO_L475VG_IOT01A | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - frequency testing (capabilities min) | 1 | 0 | OK | 0.25 |
| DISCO_L475VG_IOT01A-GCC_ARM | DISCO_L475VG_IOT01A | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - hardware ss handling | 1 | 0 | OK | 0.24 |
| DISCO_L475VG_IOT01A-GCC_ARM | DISCO_L475VG_IOT01A | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - hardware ss handling(block) | 1 | 0 | OK | 0.24 |
| DISCO_L475VG_IOT01A-GCC_ARM | DISCO_L475VG_IOT01A | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - init/free test all pins | 1 | 0 | OK | 0.95 |
| DISCO_L475VG_IOT01A-GCC_ARM | DISCO_L475VG_IOT01A | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - init/free test all pins (CS == NC) | 1 | 0 | OK | 0.23 |
| DISCO_L475VG_IOT01A-GCC_ARM | DISCO_L475VG_IOT01A | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - init/free test all pins (CS == NC, MISO/MOSI == NC) | 1 | 0 | OK | 0.64 |
| DISCO_L475VG_IOT01A-GCC_ARM | DISCO_L475VG_IOT01A | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - mode testing (MODE_1) | 1 | 0 | OK | 0.22 |
| DISCO_L475VG_IOT01A-GCC_ARM | DISCO_L475VG_IOT01A | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - mode testing (MODE_2) | 1 | 0 | OK | 0.23 |
| DISCO_L475VG_IOT01A-GCC_ARM | DISCO_L475VG_IOT01A | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - mode testing (MODE_3) | 1 | 0 | OK | 0.23 |
| DISCO_L475VG_IOT01A-GCC_ARM | DISCO_L475VG_IOT01A | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - symbol size testing (12) | 1 | 0 | OK | 0.28 |
| DISCO_L475VG_IOT01A-GCC_ARM | DISCO_L475VG_IOT01A | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - symbol size testing (16) | 1 | 0 | OK | 0.23 |
| DISCO_L475VG_IOT01A-GCC_ARM | DISCO_L475VG_IOT01A | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - symbol size testing (24) | 1 | 0 | OK | 0.28 |
| DISCO_L475VG_IOT01A-GCC_ARM | DISCO_L475VG_IOT01A | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - symbol size testing (32) | 1 | 0 | OK | 0.29 |
| DISCO_L475VG_IOT01A-GCC_ARM | DISCO_L475VG_IOT01A | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - symbol size testing (4) | 1 | 0 | OK | 0.29 |
mbedgt: test case results: 25 OK
| target | platform_name | test suite | result | elapsed_time (sec) | copy_method |
|---------------------|---------------|----------------------------------------|--------|--------------------|-------------|
| LPC55S69_NS-GCC_ARM | LPC55S69 | tests-mbed_hal_fpga_ci_test_shield-spi | OK | 37.77 | default |
mbedgt: test suite results: 1 OK
mbedgt: test case report:
| target | platform_name | test suite | test case | passed | failed | result | elapsed_time (sec) |
|---------------------|---------------|----------------------------------------|-----------------------------------------------------------|--------|--------|--------|--------------------|
| LPC55S69_NS-GCC_ARM | LPC55S69 | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - basic test | 1 | 0 | OK | 0.19 |
| LPC55S69_NS-GCC_ARM | LPC55S69 | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - basic test (direct init) | 1 | 0 | OK | 0.21 |
| LPC55S69_NS-GCC_ARM | LPC55S69 | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - block write | 1 | 0 | OK | 0.21 |
| LPC55S69_NS-GCC_ARM | LPC55S69 | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - block write(one sym) | 1 | 0 | OK | 0.19 |
| LPC55S69_NS-GCC_ARM | LPC55S69 | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - buffers tx < rx | 1 | 0 | OK | 0.27 |
| LPC55S69_NS-GCC_ARM | LPC55S69 | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - buffers tx > rx | 1 | 0 | OK | 0.25 |
| LPC55S69_NS-GCC_ARM | LPC55S69 | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - frequency testing (2 MHz) | 1 | 0 | OK | 0.22 |
| LPC55S69_NS-GCC_ARM | LPC55S69 | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - frequency testing (200 kHz) | 1 | 0 | OK | 0.22 |
| LPC55S69_NS-GCC_ARM | LPC55S69 | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - frequency testing (capabilities max) | 1 | 0 | OK | 0.22 |
| LPC55S69_NS-GCC_ARM | LPC55S69 | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - frequency testing (capabilities min) | 1 | 0 | OK | 0.24 |
| LPC55S69_NS-GCC_ARM | LPC55S69 | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - hardware ss handling | 1 | 0 | OK | 0.22 |
| LPC55S69_NS-GCC_ARM | LPC55S69 | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - hardware ss handling(block) | 1 | 0 | OK | 0.23 |
| LPC55S69_NS-GCC_ARM | LPC55S69 | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - init/free test all pins | 1 | 0 | OK | 0.59 |
| LPC55S69_NS-GCC_ARM | LPC55S69 | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - init/free test all pins (CS == NC) | 1 | 0 | OK | 0.21 |
| LPC55S69_NS-GCC_ARM | LPC55S69 | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - init/free test all pins (CS == NC, MISO/MOSI == NC) | 1 | 0 | OK | 0.39 |
| LPC55S69_NS-GCC_ARM | LPC55S69 | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - mode testing (MODE_1) | 1 | 0 | OK | 0.21 |
| LPC55S69_NS-GCC_ARM | LPC55S69 | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - mode testing (MODE_2) | 1 | 0 | OK | 0.21 |
| LPC55S69_NS-GCC_ARM | LPC55S69 | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - mode testing (MODE_3) | 1 | 0 | OK | 0.22 |
| LPC55S69_NS-GCC_ARM | LPC55S69 | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - symbol size testing (12) | 1 | 0 | OK | 0.28 |
| LPC55S69_NS-GCC_ARM | LPC55S69 | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - symbol size testing (16) | 1 | 0 | OK | 0.21 |
| LPC55S69_NS-GCC_ARM | LPC55S69 | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - symbol size testing (24) | 1 | 0 | OK | 0.26 |
| LPC55S69_NS-GCC_ARM | LPC55S69 | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - symbol size testing (32) | 1 | 0 | OK | 0.27 |
| LPC55S69_NS-GCC_ARM | LPC55S69 | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - symbol size testing (4) | 1 | 0 | OK | 0.27 |
mbedgt: test case results: 23 OK
| target | platform_name | test suite | result | elapsed_time (sec) | copy_method |
|--------------|---------------|----------------------------------------|--------|--------------------|-------------|
| K64F-GCC_ARM | K64F | tests-mbed_hal_fpga_ci_test_shield-spi | OK | 32.29 | default |
mbedgt: test suite results: 1 OK
mbedgt: test case report:
| target | platform_name | test suite | test case | passed | failed | result | elapsed_time (sec) |
|--------------|---------------|----------------------------------------|-----------------------------------------------------------|--------|--------|--------|--------------------|
| K64F-GCC_ARM | K64F | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - async mode (hw ss) | 1 | 0 | OK | 0.22 |
| K64F-GCC_ARM | K64F | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - async mode (sw ss) | 1 | 0 | OK | 0.21 |
| K64F-GCC_ARM | K64F | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - basic test | 1 | 0 | OK | 0.29 |
| K64F-GCC_ARM | K64F | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - basic test (direct init) | 1 | 0 | OK | 0.3 |
| K64F-GCC_ARM | K64F | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - block write | 1 | 0 | OK | 0.2 |
| K64F-GCC_ARM | K64F | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - block write(one sym) | 1 | 0 | OK | 0.21 |
| K64F-GCC_ARM | K64F | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - buffers tx < rx | 1 | 0 | OK | 0.26 |
| K64F-GCC_ARM | K64F | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - buffers tx > rx | 1 | 0 | OK | 0.26 |
| K64F-GCC_ARM | K64F | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - frequency testing (2 MHz) | 1 | 0 | OK | 0.22 |
| K64F-GCC_ARM | K64F | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - frequency testing (200 kHz) | 1 | 0 | OK | 0.23 |
| K64F-GCC_ARM | K64F | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - frequency testing (capabilities max) | 1 | 0 | OK | 0.22 |
| K64F-GCC_ARM | K64F | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - frequency testing (capabilities min) | 1 | 0 | OK | 0.25 |
| K64F-GCC_ARM | K64F | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - hardware ss handling | 1 | 0 | OK | 0.22 |
| K64F-GCC_ARM | K64F | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - hardware ss handling(block) | 1 | 0 | OK | 0.23 |
| K64F-GCC_ARM | K64F | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - init/free test all pins | 1 | 0 | OK | 0.81 |
| K64F-GCC_ARM | K64F | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - init/free test all pins (CS == NC) | 1 | 0 | OK | 0.52 |
| K64F-GCC_ARM | K64F | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - init/free test all pins (CS == NC, MISO/MOSI == NC) | 1 | 0 | OK | 0.22 |
| K64F-GCC_ARM | K64F | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - mode testing (MODE_1) | 1 | 0 | OK | 0.21 |
| K64F-GCC_ARM | K64F | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - mode testing (MODE_2) | 1 | 0 | OK | 0.21 |
| K64F-GCC_ARM | K64F | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - mode testing (MODE_3) | 1 | 0 | OK | 0.21 |
| K64F-GCC_ARM | K64F | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - symbol size testing (12) | 1 | 0 | OK | 0.27 |
| K64F-GCC_ARM | K64F | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - symbol size testing (16) | 1 | 0 | OK | 0.21 |
| K64F-GCC_ARM | K64F | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - symbol size testing (24) | 1 | 0 | OK | 0.27 |
| K64F-GCC_ARM | K64F | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - symbol size testing (32) | 1 | 0 | OK | 0.26 |
| K64F-GCC_ARM | K64F | tests-mbed_hal_fpga_ci_test_shield-spi | SPI - symbol size testing (4) | 1 | 0 | OK | 0.27 |
mbedgt: test case results: 25 OK
```
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----------------------------------------------------------------------------------------------------------------
